Analyze and Optimize 32- to 56-gpbs Serial Link Channels

This webcast introduces a forensic channel analysis approach that implements both measurement hardware and EDA tools with contemporary SerDes internal tools (e.g., internal eye scan) for the purpose of optimizing the BER for highly pathological channels (i.e. identifying the major contributors to signal degradation in the link). State-of-the-art pulse response analysis such as this, provides valuable insight into the behavior of the channel and the effective use of CTLE, FFE, and DFE equalization techniques, in order to mitigate crosstalk, attenuation and return loss.

Specific topics to be covered include: optimization, BER, PAM-4, IBIS-AMI, S-parameters, causality, passivity, EQ, DFE, FFE, CTLE, and the latest in pulse response analysis and optimization.

Four Essential Steps For EDA Simulation Measurement Mastery

This seminar will help you achieve this level of modeling measurement using Simbeor as demonstrated using Wild River Technology’s CMP-28 Advanced Channel Modeling Platform in a systematized and high-confidence approach

  • Step 1: Measure S-parameters and validate quality
  • Step 2: Import and adjust stack-up and board geometry into EDA tool
  • Step 3: Identify broadband dielectric and conductor roughness models
  • Step 4: Simulate all structures on the validation board without further adjustments and compare magnitude and phase of S-parameters, TDR/TDT and eye diagrams

How To Use Fixture De-Embedding To Match Signal Integrity Simulation To Measurements

This video provides a quick overview of how fixture de-embedding from measurements, or embedding into simulations is a critical step for matching simulations to measurements for physical layer Tx to Rx channels. Multigigabit channels that include multi-layer laminate or printed circuit board structures require a fixture to go from the coaxial connections of the measuring instrument to the planar transmission line structures on a PCB. This fixture is not calibrated out by the coaxial calibration of the instrument and is often neglected in the simulation.