Methods of Improving 3D EM Model Development and Associated Time/Frequency Domain Measurements
Topics:
- For the Metrologist: Practical calibration methods suited for 3D-EM
- For the Signal Integrity Practitioner: Verification and assurance
- For the 3D-EM Modeler: Time domain processing and 3D-EM model development
Tips:
- Low frequency data is just as important as high frequency in both measurement and models
- Remember the basics: Start with the appropriate calibration and verify it
- Beware of the tools: Understand what they are doing
- Simulate to reduce design turns but measure to close the loop
Robust Method for Addressing 12 Gbps Interoperability for High-Loss and Crosstalk-Aggressed Channels
This presentation addresses a new methodology for 12 Gbps interoperability that combines a concerted family of pathological channels, internal eye monitoring, and external EQ simulation tools, providing insight into an EQ optimization strategy that addresses the specific channel’s mix of crosstalk noise, jitter, and channel loss. This also provides a backplane designer the ability to configure a high-loss, crosstalk aggressed system. The method, combining co-simulation channel optimization, a reconfigurable channel platform, and receiver eye monitoring, has two key benefits; the separation of channel eye opening versus un-equalizable Deterministic Jitter (Dj), and the capability to map loss-crosstalk space for a particular SERDES channel pair, a new concept in SERDES interoperability evaluation. The method is described in detail, followed by relevant case examples using hardware specifically designed for this endeavor. Finally, we compare eye monitor results with the original co-simulation, validating the method.
Measurement-Assisted Electromagnetic Extraction of Interconnect Parameters on Low-Cost FR-4 Boards for 6-20 Gb/sec Applications
Design of interconnects on PCBs for 6-10 Gb/s data rates requires electromagnetic models from DC up to 20 GHz. Manufacturers of low-cost FR-4 PCBs typically provide values for dielectric constant and loss tangent either at one frequency or without specifying frequency value at all, that is not acceptable for the broad-band models. A simple and practical methodology to extract frequency-dependent dielectric parameters on the base of correlation of measurements and simulations is proposed. A board with 30 test structures has been built to validate the extraction methodology and to verify possibilities to predict interconnect parameters with the electromagnetic analysis.
Calibration and De-Embedding Techniques in the Frequency Domain
Topics:
- Calibrate and De-Embedding Concepts
- Selecting a Suitable Measurement Approach
- Examples of SOLT and TRL measurements
- Creating a TRL calibration kit
- Measurements of Calibration Accuracy
- Examples of 3D field solver measure-based correspondence
