This presentation explores key considerations and tradeoffs involved in achieving reliable simulation-to-measurement alignment, with examples spanning both time-domain and frequency-domain analysis.
This presentation analyzes second-order design features using precision measurements of test vehicles and digital twins. We propose a metric-driven methodology based on AI/ML to determine relevant parameters for simulating anisotropic [...]
This tutorial aims to demystify crosstalk by explaining its mechanisms, quantification, and mitigation strategies.
In the context of the IEEE P370 standard activities, the members collected data on how measurement results and de-embedding results can vary across different teams. In this paper, we present the analysis of the data collected.
We analyze the computational procedure specified for Channel Operation Margin (COM) and compare it to traditional statistical eye/BER analysis
Practical calibration methods suited for 3D-EM, Verification and assurance, and Time domain processing and 3D-EM model development.
This paper addresses a new methodology for 12 Gbps interoperability that combines a concerted family of pathological channels, internal eye monitoring, and external EQ simulation tools, providing insight into an EQ optimization strategy that addresses the specific channel’s mix of crosstalk noise, jitter, and channel loss.
A novel method for extraction of dispersive dielectric parameters to 50 GHz is proposed. The method doesn’t require advanced de-embedding, and is based on correlation of measured and simulated generalized modal S-parameters of a line segment. First, VNA measurements for two line segments are made and used to compute generalized S-parameters of a difference segment. Second, 3D full-wave model of the difference segment with conductor model with roughness is used to identify the dielectric properties. We finalize the paper with the derivation of dielectric models for low-cost FR4-type and for expensive low-loss high-frequency materials. The advanced models can be used for practical electromagnetic analysis of interconnects for the 6-100 Gb/s realm.
A simple and practical methodology to extract frequency-dependent dielectric parameters on the base of correlation of measurements and simulations is proposed.
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