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Alfred Neves

Free signal integrity? How understanding anisotropic materials and tolerances could increase performance at 112/224Gbps and beyond

2026-03-19T14:52:49-08:00

The paper includes a study of the influence of anisotropy on the channel performance and examines methods to extract out the level of anisotropy. The overall goal is to achieve better than 2% measurement-simulation correlation in impedance profiles. This approach allows for optimized geometries and controlled geometry designs.

Free signal integrity? How understanding anisotropic materials and tolerances could increase performance at 112/224Gbps and beyond2026-03-19T14:52:49-08:00

S-Parameter Measurement and Fixture De-Embedding Variation Across Multiple Teams, Equipment and De-Embedding Tools

2026-03-19T15:06:37-08:00

In the context of the IEEE P370 standard activities, the members collected data on how measurement results and de-embedding results can vary across different teams. In this paper, we present the analysis of the data collected.

S-Parameter Measurement and Fixture De-Embedding Variation Across Multiple Teams, Equipment and De-Embedding Tools2026-03-19T15:06:37-08:00

Developing Unified Methods of 3D Electromagnetic Extraction, System Level Channel Modeling, and Robust Jitter Decomposition in Crosstalk Stressed 10Gbpsec Serial Data Systems

2026-03-19T16:28:05-08:00

As serial link speeds increase, systems become more “Stressed”. Loss, low probability deterministic jitter, crosstalk aggression from densely packed signal nets, via and connector impedance and associated resonances, and package [...]

Developing Unified Methods of 3D Electromagnetic Extraction, System Level Channel Modeling, and Robust Jitter Decomposition in Crosstalk Stressed 10Gbpsec Serial Data Systems2026-03-19T16:28:05-08:00

Practical identification of dispersive dielectric models with generalized modal S-parameters for analysis of interconnects in 6-100 Gb/s applications

2026-03-18T08:39:54-08:00

A novel method for extraction of dispersive dielectric parameters to 50 GHz is proposed. The method doesn’t require advanced de-embedding, and is based on correlation of measured and simulated generalized modal S-parameters of a line segment. First, VNA measurements for two line segments are made and used to compute generalized S-parameters of a difference segment. Second, 3D full-wave model of the difference segment with conductor model with roughness is used to identify the dielectric properties. We finalize the paper with the derivation of dielectric models for low-cost FR4-type and for expensive low-loss high-frequency materials. The advanced models can be used for practical electromagnetic analysis of interconnects for the 6-100 Gb/s realm.

Practical identification of dispersive dielectric models with generalized modal S-parameters for analysis of interconnects in 6-100 Gb/s applications2026-03-18T08:39:54-08:00
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