The presentation touches on several issues that need to be considered for the AI/112/224/448G space. This includes material Identification for EDA tools, metrics for simulation to measurement that folks are not grooving on but should. It touches on TDR EDA analysis calibration methodology, something that most folks ignore. Another deliverable is how to advance your EDA 3D EM optimization methods using E-field visualization. It is a really good and relevant discussion from folks that live Extreme Signal Integrity.

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