This presentation explores key considerations and tradeoffs involved in achieving reliable simulation-to-measurement alignment, with examples spanning both time-domain and frequency-domain analysis.
The paper includes a study of the influence of anisotropy on the channel performance and examines methods to extract out the level of anisotropy. The overall goal is to achieve better than 2% measurement-simulation correlation in impedance profiles. This approach allows for optimized geometries and controlled geometry designs.
Reducing channel loss can enable lower power or longer unrepeated channel lengths.
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