The paper includes a study of the influence of anisotropy on the channel performance and examines methods to extract out the level of anisotropy. The overall goal is to achieve better than 2% measurement-simulation correlation in impedance profiles. This approach allows for optimized geometries and controlled geometry designs.
This presentation discusses 400G test and measurement challenges.
In this presentation, we demonstrate new de-embedding techniques integrated into VNA firmware that make frequency-domain signal integrity measurements easier, more accurate, and less error-prone. We also present new tools to predict system response to arbitrary time domain signals.
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